Combination of In-Circuit and Functional Test Programs

Recognizing that most products will require some form of functional test before shipment to customers, a more logical approach would to be to combine when possible In-Circuit Testing (ICT) and Functional Testing (FBT) into a single stage. Combination of functional test with ICT can also be used to achieve higher fault coverage that may not be possible with ICT only test strategy. Single stage test strategy using a single test fixture can save test-time and capital expenditure, and reduces the potential for errors and damage caused by excessive board handling.
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