Advanced In-Circuit Test Programs

Solutions 4-2The Advanced programs are designed for complex boards and for customers that require the maximum fault coverage possible at the ICT stage. The Advanced programs include steps listed in the Standard Programs as well as the following steps if applicable:
  • Advanced Boundary Scan
  • Parallel Access Template Development for device programming
  • Test Vector and grey code development
  • Digital Cluster Tests
  • Vectorless Test
  • LED color and intensity check
  • Combination of In-Circuit & Functional Test
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