Boundary Functional Test (BFT)

BFT finds faults in internal device logic. The BFT module uses optional built-in test features available on some boundary scan devices to test internal device logic as part of an assembly or board-level test.

BFT is an effective test pattern generation tool for manufacturers who retest internal device logic as part of the assembly process and for repair depots responsible for isolating failures in the field. Supports four techniques for internal testing of IEEE 1149.1 devices:

1. Functional test of the device TAP and scan register circuitry
Functional test of the device TAP and scan register circuitry
2. Device logic test using the 1149.1 INTEST instruction
Device logic test using the 1149.1 INTEST instruction
3. Device logic test using internal scan technology
Device logic test using internal scan technology
4. Device logic test using the 1149.1 RUN BIST instruction
Device logic test using the 1149.1 RUN BIST instruction
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