ScanBox is the next generation Boundary Scan (JTAG) test platform. Based on Acculogic’s high performance JPCI 32-bit TAP controller chip with patented Adaptive Clocking Technology. ScanBox’s built-in Ethernet and USB2 provides the flexibility and performance required for Remote Distributed Testing (RDT). ScanBox combines built-in Boundary Scan controller and PC-standard connectivity with the modularity and size reduction of card cage-based systems. ScanBox’s compact, flexible package, high-speed data rates and reliable operation meet the needs of R&D and manufacturing and test engineers delivering electronics for the aerospace/defense, automotive, industrial, and medical and consumer electronics markets.
Features- Supports IEEE1149.1 and IEEE1149.6 standards
- Supports test and device programming
- JPCI™ 32-bit (IEEE 1149.1) bus controller – more info.
- Fast throughput of up to 25 Mbits/sec
- 100 MHz system clock with programmable TCK rate
- Adaptive Clocking™ Technology
- 9 general purpose fully programmable parallel I/O channels
- 2 MB cache multipage memory behind TDI/TDO more info…
- Delivers industry standard vector formats SVF, JAM/ STAPL, IEEE1532
- Drive Level = 1.65V to 5.0V (1.65V, 1.8V, 2.5V, 3.3V and 5V)
- TCK = 100KHz to 25MHz (with 10KHz resolution)
- Configurable to access multiple scan chains (up to 16)
