Acculogic introduces: Dynamic Test on the fly with Network Analyzer “BodeScan”
1.Overview
Small value capacitors, inductors, resistors and crystals can now be tested by using the BodeScan option of the Flying Scorpion. Even complex parallel combinations of these devices can be tested. Values as small as 2pf for capacitors and 100nH for inductors can be now be tested.2.Methodology
BodeScan is a dynamic analog method of testing complex two-terminal networks. In the example below, a complex network of a tuned circuit with filter, that consists of small capacitor with parallel inductor and resistor.
Since the BodeScan method allows the frequency applied to L-C resonant circuits to be varied, the attenuation and phase frequency responses of resonant circuits and filters can be plotted. The values of the capacitors (C), inductors (L) and resistors (R) within such a network can be determined by plotting and evaluating a Bode diagram.
By sweeping the input frequency the operation of quartz crystals and filter circuits transfer function to be characterized and tested.
Here are the two bode software test templates, Bode and RLC Bode:
3.Bode Hardware
The BodeScan system uses a HF Measurement head (Bodebox) that is mounted onto a camera module. Up to 4 Bodeboxes can be used within the system. Each Bodebox is directly connected to two adjacent Probe Modules using coax. There is a controller box mounted inside the system PC.4.Specification
| Frequency range Level | 1kHz to 15MHz, resolution 32 bit, continuously variable |
| Amplitude (sinusoidal signal) | 100, 200, 400 and 500mVpp |
| DC offset | ± 360mV (can be switched off) |
| Resistance measurement (2 wire only | 10 Ω to 150kΩ in 2 overlapping ranges, resolution 12 bit, exponential, error 5% |
| Capacitance measurement | 1.6pF to 20μF, resolution 0.01pF error at < 2MHz: 3% error at > 2MHz: 8% |
| Inductance measurement | 100nH to 20H, resolution 2.5nH error at < 2MHz: 3% error at > 2MHz: 8% |
| Filters, resonant circuits | Test for phase shift and attenuation characteristic |
| DYNAMIC TESTS (Bode diagram) Frequency range | 1kHz to 15MHz, resolution 32 bit, continuously variable |
| DYNAMIC TESTS (Bode diagram) Frequency range | Test of ability to oscillate from 100 kHz to 15 MHz |
| Phase measurement | ±175°, resolution 0.09°, error at < 2MHz: < 1° error at > 2MHz: < 5 |