Acculogic’s ScanNavigator boundary scan test environment, presents an easy, cost effective, and a robust way to perform boundary scan (JTAG) test and programming using Teradyne’s Di-Series & Teradyne’s High Speed… read more →
Acculogic announces support for Test Coverage Optimization between the flagship FLS980 Flying Probe Test System and boundary scan tool vendors JTag Technologies and Corelis. The key advantage here is that… read more →
One of the main objectives of an in-circuit test program is to achieve the highest test coverage – preferably close to 100%. However, in many cases, the lack of test… read more →
Using Acculogic’s ScanNavigator integrated boundary scan test environment, offers a quick, easy, and a cost effective way to perform boundary scan test using Teradyne’s Di-Series, which is a family of… read more →
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The appearance of VLSI components contained in smaller packages placed closer together has created new challenges in testing electronic circuit assemblies. Faced with, an increasing number of layers in the PCB,… read more →
IEEE 1149.1, also known as JTAG or Boundary Scan, was introduced in 1990. This standard endeavors to solve test and diagnostic problems arising from loss of physical access caused by… read more →
Flash memory devices have become the solution of choice as storage devices in many applications including handheld and mobile equipment such as mobile phones, PDAs etc. Flash devices combine high… read more →
ISP refers to programming or configuring programmable hardware devices such as Programmable Logic Devices (PLDs), Programmable Array Logic (PALs), and Complex Programmable Logic Devices (CPLDs) after they have been assembled… read more →