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Testing Densely Packed Boards with nanoVTEP

As modern electronic devices are becoming miniaturized with more components; traditional probing methods face significant challenges in testing these densely packed elements.  Incorporating vectorless testing into your overall testing strategy is critical to address these challenges and ensure comprehensive coverage and reliability.

Keysight's Vectorless Test EP (VTEP) technology was developed to overcome the limitations of traditional in-circuit test (ICT) methods like the TestJet system. While TestJet was groundbreaking in the early 1990s, providing reliable measurements for devices with lead frames and large geometries, it struggles with today’s complex package types such as BGAs, micro-BGAs, and SMT edge connectors. VTEP significantly enhances test coverage by over 80% compared to TestJet, especially for hard-to-test packages. It includes an auto-debug capability that sets thresholds on a per-pin basis, addressing the variability and challenges of modern components to ensure accurate and efficient testing. This makes VTEP essential for maintaining high standards of quality and reliability in electronic manufacturing.

As devices have become smaller, the amplifiers used in VTEP testing have become too large. Keysight's NanoVTEP Vectorless Test Solutions offer more robust analysis with a smaller footprint. Keysight has developed a method to test the smaller, less powerful signals emitted by these modern devices.

nanoVTEP evolution

Keysight's nanoVTEP was developed to be 60% smaller than traditional VTEP probes, addressing the challenges of accessing densely packed PCBs. The primary advantage of the nanoVTEP is its ability to perform vectorless testing on small electronic components, down to sizes as small as 4mm by 4mm. The slim profile allows you to implement vectorless testing in high density fixtures, thereby increasing coverage and fault detection rate in the test process.

By enabling vectorless testing with a smaller probe, it allows engineers to implement more efficient and effective testing protocols, leading to improved reliability and performance of electronic devices. Acculogic supports the integration of advanced accessories and technologies, like the nanoVTEP, with the Keysight i3070 systems. Acculogic offers in-circuit/ATE test programming services for Keysight 3070 test equipment and other platforms. Get the support you need to have fast, reliable, and cost-effective production test solutions.