A few days ago, we released version 5.4 of our Integrator software, which is the operating system for Acculogic’s Flying Probe FLS series. Below is a list of the major… read more →
Using Acculogic’s ScanNavigator integrated boundary scan test environment, offers a quick, easy, and a cost effective way to perform boundary scan test using Teradyne’s Di-Series, which is a family of… read more →
Your feedback is important to us! By completing this short 1 minute survey, you will provide us with valuable information, which will help us to gain a better understanding of… read more →
If you are considering getting a quote for your ICT program development and fixture fabrication, then here is the list of files that we would need from you: 1. CAD… read more →
The appearance of VLSI components contained in smaller packages placed closer together has created new challenges in testing electronic circuit assemblies. Faced with, an increasing number of layers in the PCB,… read more →
IEEE 1149.1, also known as JTAG or Boundary Scan, was introduced in 1990. This standard endeavors to solve test and diagnostic problems arising from loss of physical access caused by… read more →
Flash memory devices have become the solution of choice as storage devices in many applications including handheld and mobile equipment such as mobile phones, PDAs etc. Flash devices combine high… read more →
ISP refers to programming or configuring programmable hardware devices such as Programmable Logic Devices (PLDs), Programmable Array Logic (PALs), and Complex Programmable Logic Devices (CPLDs) after they have been assembled… read more →
1149.1 deals with test for digital assemblies 1149.4 deals with test for mixed signal and analog assemblies 1149.5 deals with test at system level 1149.2 has merged with 1149.1 group(Obsolete)… read more →
IEEE Std 1149.1-1990 and IEEE Std 1149.1a-1993 (a major supplement) define the architecture of the Test Access Port (TAP) and shift-registers implemented in boundary-scan devices. For boundary scan testing, signal… read more →